The Jeol JSM-5600 SEM, is a high vacuum SEM with tungsten filament electron source, Secondary Electron detector and digital output. Samples ranging up to 30mm in diameter can be examined with full coverage yielding surface morphology and topographic contract images.
Electron Microscopy
The electron-microscopy suite houses a Jeol JSM-5600 high vacuum Scanning Electron Microscope with secondary election detector and digital output, and a Jeol JEM-1010, high-contrast Transmission Electron Microscope, with an AMT CCD camera for digital imaging.